Eamani, Ramakrishna Reddy, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, India

• Vol 13, No 1: March 2024 - VLSI Design
  Role of tuning techniques in advancing the performance of negative capacitance field effecting based full adder
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International Journal of Reconfigurable and Embedded Systems (IJRES)
p-ISSN 2089-4864, e-ISSN 2722-2608
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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