Vasantha, N., ECE Dept, BVRIT, Hyderabad, Telangana, India, India

• Vol 7, No 1: March 2018 - Other articles
  BIST Architecture using Area Efficient Low Current LFSR for Embedded Memory Testing Applications Applications
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International Journal of Reconfigurable and Embedded Systems (IJRES)
p-ISSN 2089-4864, e-ISSN 2722-2608
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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