Fook, Lee Weng, Emerald System Design Center, Malaysia

• Vol 11, No 2: July 2022 - Other articles
  Automatic generation of user-defined test algorithm description file for memory BIST implementation
  Abstract  PDF

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International Journal of Reconfigurable and Embedded Systems (IJRES)
p-ISSN 2089-4864, e-ISSN 2722-2608
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).