Selvan, S.Tamil, Bharath Institute of Higher Education & Research Chennai, India
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Vol 8, No 2: July 2019 - Other articles
Comparison analysis of three value logic 8T CNTFET SRAM Cell with 6 CMOS SRAM CELL at 32nm technology
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International Journal of Reconfigurable and Embedded Systems (IJRES)
p-ISSN 2089-4864, e-ISSN 2722-2608
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).