Vasantha Rayudu, Kurada Veera Bhoga, Reliability Engineering Division, India

• Vol 9, No 2: July 2020 - Other articles
  Modern design approach of faults (toggling faults, bridge faults and SAT) of reduced ordered binary decision diagram based on combo & sequential blocks
  Abstract  PDF

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International Journal of Reconfigurable and Embedded Systems (IJRES)
p-ISSN 2089-4864, e-ISSN 2722-2608
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).